EconPapers    
Economics at your fingertips  
 

Estimating and predicting multivariate volatility thresholds in global stock markets

Fabio Trojani () and Francesco Audrino ()

Journal of Applied Econometrics, 2006, vol. 21, issue 3, pages 345-369

Abstract: We propose a general double tree structured AR-GARCH model for the analysis of global equity index returns. The model extends previous approaches by incorporating (i) several multivariate thresholds in conditional means and volatilities of index returns and (ii) a richer specification for the impact of lagged foreign (US) index returns in each threshold. We evaluate the out-of-sample forecasting power of our model for eight major equity indices in comparison to some existing volatility models in the literature. We find strong evidence for more than one multivariate threshold (more than two regimes) in conditional means and variances of global equity index returns. Such multivariate thresholds are affected by foreign (US) lagged index returns and yield a higher out-of-sample predictive power for our tree structured model setting. Copyright © 2006 John Wiley & Sons, Ltd.

Date: 2006
View list of references View citations in EconPapers

Downloads: (external link)
http://hdl.handle.net/10.1002/jae.869 Link to full text; subscription required (text/html)
http://qed.econ.queensu.ca:80/jae/2006-v21.3/ Supporting data files and programs (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: http://EconPapers.repec.org/RePEc:jae:japmet:v:21:y:2006:i:3:p:345-369

Ordering information: This journal article can be ordered from
http://www3.intersci ... e.jsp?issn=0883-7252

Access Statistics for this article

Journal of Applied Econometrics is edited by M. Hashem Pesaran

More articles in Journal of Applied Econometrics from John Wiley & Sons, Ltd.
Series data maintained by Christopher F. Baum ().

 
Page updated 2009-11-24
Handle: RePEc:jae:japmet:v:21:y:2006:i:3:p:345-369