Abstract:
In this work we propose Bayesian measures to quantify the influence of observations on the structural parameters of the simple measurement error model (MEM). Different influence measures, like those based on q-divergence between posterior distributions and Bayes risk, are studied to evaluate the influence. A strategy based on the perturbation function and MCMC samples is used to compute these measures. The samples from the posterior distributions are obtained by using the Metropolis-Hastings algorithm and assuming specific proper prior distributions. The results are illustrated with an application to a real example modeled with MEM in the literature.