Goodness-of-fit tests for regression using kernel methods

Yacine Ait-Sahalia, Peter J. Bickel and Thomas M. Stoker

No 3747-94., Working papers from Massachusetts Institute of Technology (MIT), Sloan School of Management

Keywords: HD28 .M414 no.3747-94 (search for similar items in EconPapers)
Date: 1994
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