Design and manufacturing of digital integrated circuits tester at gate/flip flop level using Arduino mega platform

Yasir Hashim Naif (), Marwa Awni (), Abdullah Mufeed () and Mohd Abdul-Rahim Khan ()

International Journal of Innovative Research and Scientific Studies, 2025, vol. 8, issue 7, 738-748

Abstract: This study paper aims to deliver a low-cost, computer-independent, and user-friendly 74, 54, and 4000-series logic Integrated Circuits (ICs) tester. Depending on the truth table of gates and the IC configuration, the logic IC tester will be able to test the function of those ICs' 74, 54, and 4000 series logic gates (NOR, OR, AND, NAND, XOR) and Flip-Flops (JK, D, T). The logic IC functional tester can be reprogrammed and updated depending on the flexibility provided by this design and using personal computer. The result of the testing of any 74-series IC will be displayed on liquid crystal display at unit level (gate or flip-flop). De-pending on the test results, the logic IC functional tester was successfully built and is fully operational.

Keywords: Arduino Mega; Digital IC; Logic gate; Testing IC. (search for similar items in EconPapers)
Date: 2025
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