Analysis of Abnormal Secondary Voltage of 500 KV HGIS Line

Xiangwen He, Shaolin Kuang, Bixian Zhu, Zhengwei Feng, Zhanfeng Wu, An Du, Xiaojia Ye, Xiaohan Gou and Junkang Wang

GBP Proceedings Series, 2025, vol. 7, issue None, 24-31

Abstract: A 500kV HGIS line experienced an abnormal voltage data alarm for the 3U0 voltage. Through on-site sampling verification, loop temperature measurement, and theoretical analysis, it was determined that a grounding fault existed in the secondary internal circuit of the line voltage transformer (PT), causing abnormal secondary voltage sampling outputs from two sets of line protection systems. This article provides a detailed account of the abnormal event, on-site inspection findings, fault cause analysis, and the results of the return-to-factory inspection, along with proposed corrective measures. The aim is to provide a reference for the investigation and prevention of similar issues.

Keywords: HGIS; PT; voltage circuit; sampling anomaly (search for similar items in EconPapers)
Date: 2025
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Persistent link: https://EconPapers.repec.org/RePEc:axf:gbppsa:v:7:y:2025:i:none:p:24-31

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