Discussion of “Assessing the goodness‐of‐fit of logistic regression models in large samples: A modification of the Hosmer‐Lemeshow test,” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow

Li‐Ching Chen and Jiun‐Yi Wang

Biometrics, 2020, vol. 76, issue 2, 569-571

Date: 2020
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