An Application of the Truncated Two‐Piece Normal Distribution to the Measurement of Depths of Arsenic Implants in Silicon

A. C. Kimber and C. Jeynes

Journal of the Royal Statistical Society Series C, 1987, vol. 36, issue 3, 352-357

Abstract: The truncated two‐piece Normal distribution is applied to data obtained from backscattering experiments in order to investigate the depth of Arsenic implants in Silicon.

Date: 1987
References: Add references at CitEc
Citations: View citations in EconPapers (4)

Downloads: (external link)
https://doi.org/10.2307/2347794

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:bla:jorssc:v:36:y:1987:i:3:p:352-357

Ordering information: This journal article can be ordered from
http://ordering.onli ... 1111/(ISSN)1467-9876

Access Statistics for this article

Journal of the Royal Statistical Society Series C is currently edited by R. Chandler and P. W. F. Smith

More articles in Journal of the Royal Statistical Society Series C from Royal Statistical Society Contact information at EDIRC.
Bibliographic data for series maintained by Wiley Content Delivery ().