Modelling accelerated life test data by using a Bayesian approach

Debajyoti Sinha, Kauhsik Patra and Dipak K. Dey

Journal of the Royal Statistical Society Series C, 2003, vol. 52, issue 2, 249-259

Abstract: Summary. Because of the high reliability of many modern products, accelerated life tests are becoming widely used to obtain timely information about their time‐to‐failure distributions. We propose a general class of accelerated life testing models which are motivated by the actual failure process of units from a limited failure population with a positive probability of not failing during the technological lifetime. We demonstrate a Bayesian approach to this problem, using a new class of models with non‐monotone hazard rates, the hazard model with potential scope for use far beyond accelerated life testing. Our methods are illustrated with the modelling and analysis of a data set on lifetimes of printed circuit boards under humidity accelerated life testing.

Date: 2003
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