Testing the Goodness of Fit of Parametric Regression Models with Random Toeplitz Forms

Axel Munk

Scandinavian Journal of Statistics, 2002, vol. 29, issue 3, 501-533

Abstract: ABSTRACT: We introduce a class of Toeplitz‐band matrices for simple goodness of fit tests for parametric regression models. For a given length r of the band matrix the asymptotic optimal solution is derived. Asymptotic normality of the corresponding test statistic is established under a fixed and random design assumption as well as for linear and non‐linear models, respectively. This allows testing at any parametric assumption as well as the computation of confidence intervals for a quadratic measure of discrepancy between the parametric model and the true signal g;. Furthermore, the connection between testing the parametric goodness of fit and estimating the error variance is highlighted. As a by‐product we obtain a much simpler proof of a result of Hall et al. (1990) concerning the optimality of an estimator for the variance. Our results unify and generalize recent results by Brodeau (1993) and Dette & Munk (1998a,b) in several directions. Extensions to multivariate predictors and unbounded signals are discussed. A simulation study shows that a simple jacknife correction of the proposed test statistics leads to reasonable finite sample approximations.

Date: 2002
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