A Note on the Continuous Sampling Plan CSP-V
Chen Chung-Ho and
Chou Chao-Yu
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Chen Chung-Ho: Department of Industrial Management, Southern Taiwan University of Technology, 1 Nan-Tai Street, Yung-Kang City, Tainan 710, Taiwan
Chou Chao-Yu: Department of Industrial Engineering and Management, National Yunlin University of Science and Technology, Touliu 640, Taiwan
Stochastics and Quality Control, 2002, vol. 17, issue 2, 235-239
Abstract:
This note investigates the problem of minimizing the average fraction inspected (AFI) for a CSP – V plan. A solution procedure is developed to find the sampling plan parameters that meet the average outgoing quality limit (AOQL) requirement, while minimizing the AFI when the process average (> AOQL) is known.
Keywords: Continuous Sampling Plan; Average Outgoing Quality (AOQ); Average Outgoing Quality Limit (AOQL); Average Fraction Inspected (AFI) (search for similar items in EconPapers)
Date: 2002
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DOI: 10.1515/EQC.2002.235
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