A Capability Index Calibrated to the Nonconformance Probability

Ho Linda Lee, Borges Wagner Sousa and Barriga Glady D. C.
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Ho Linda Lee: EPUSP, C.P. 61548, 05424-970, São Paulo, S.P, Brazil
Borges Wagner Sousa: IME - USP, C.P.66281, 05315-970, São Paulo, S.P., Brazil
Barriga Glady D. C.: EPUSP, C.P. 61548, 05424-970, São Paulo, S.P, Brazil

Stochastics and Quality Control, 2004, vol. 19, issue 1, 45-59

Abstract: Process Capability indices have become popular for describing how well a process meets specified tolerances. The lack of affinity with the process nonconformance probability p and the difficulty of dealing with the sampling distribution of their natural estimators affect greatly the use of the traditional indices as Cp, Cpk, Cpm and Cpkm. In this paper, a capability index is proposed which is calibrated to the nonconformance probability. Moreover, Bayesian inference procedures under multinomial sampling are developed for simplifying application of the index in industry.

Keywords: Process capability analysis; nonconformance probability; two-sided specification limits; one-sided specification limit (search for similar items in EconPapers)
Date: 2004
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DOI: 10.1515/EQC.2004.45

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