Semi-Parametric Estimation of PX,Y (X > Y)
Jeevanand E. S.,
Alice P. M. and
Hitha N.
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Jeevanand E. S.: Department of Mathematics and Statistics, Union Christian College, Aluva - 2, Kerala, India. radhajeevanand@sancharnet.in
Alice P. M.: Department of Mathematics and Statistics, Union Christian College, Aluva - 2, Kerala, India
Hitha N.: Department of Statistics, Mahrajas College, Ernakulam, Kerala, India
Stochastics and Quality Control, 2008, vol. 23, issue 2, 171-180
Abstract:
In the context of reliability the stress-strength model describes the life of a component which has a random strength X and is subject to a stress Y. The component fails at the instant the stress applied to it exceeds the strength and the component will work satisfactory in case of the event {(x, y) | x > y}. Thus R = PX,Y ({(x, y) | x > y}) is a measure of system reliability. In this paper, we obtain semi parametric estimators of the reliability under stress-strength model for the exponential distribution under complete and censored samples. We illustrate the performance of the estimators using a simulation study.
Keywords: Exponential distribution; Reliability; Censored sample; Semi parametric estimates (search for similar items in EconPapers)
Date: 2008
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Persistent link: https://EconPapers.repec.org/RePEc:bpj:ecqcon:v:23:y:2008:i:2:p:171-180:n:2
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DOI: 10.1515/EQC.2008.171
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