Design of Optimal Reliability Acceptance Sampling Plans for Exponential Distribution

Kumar Mahesh () and P C Ramyamol ()
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Kumar Mahesh: Department of Mathematics, National Institute of Technology Calicut, PIN 673601, Kerala, India
P C Ramyamol: Department of Mathematics, National Institute of Technology Calicut, PIN 673601, Kerala, India

Stochastics and Quality Control, 2016, vol. 31, issue 1, 23-36

Abstract: In this paper, an attempt is made to derive the most efficient economic reliability sampling plans for accepting a lot containing identical units having exponentially distributed lifetime with parameter θ. We consider two types of sampling plans, namely, (a) sequential sampling plan (t1,t2)${(t_1,t_2)}$ and (b) repetitive group sampling plan (n,t1,t2)${(n,t_1,t_2)}$. Under plan (a), the lot is rejected when the time between successive failures (Yr)${(Y_r)}$ is less than t1, and accepted when Yr≥t2${Y_r\ge t_2}$. The testing will continue for t1≤Yr

Keywords: Acceptance Sampling Plan; Exponential Distribution; Type I Censoring; Type II Censoring; Optimization (search for similar items in EconPapers)
Date: 2016
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DOI: 10.1515/eqc-2015-0005

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