Reliability Test Plans for Percentiles Based on the Harris Generalized Linear Exponential Distribution

Jose K. K. () and Paul Albin ()
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Jose K. K.: Department of Statistics, St.Thomas College Pala, Arunapuram; and Mahathma Gandhi University, Kottayam, Kerala, 686574India
Paul Albin: Department of Statistics, St.Thomas College Pala, Arunapuram; and Mahathma Gandhi University, Kottayam, Kerala, 686574India
Authors registered in the RePEc Author Service: Jose K. Kanichukattu ()

Stochastics and Quality Control, 2018, vol. 33, issue 1, 61-70

Abstract: In this paper, a generalization of the Harris family of distributions, namely, the Harris generalized linear exponential distribution is discussed. The use of the model is established by fitting it to a real data set. Also, we derive a reliability test plan for acceptance or rejection of a lot of products submitted for inspection with lifetimes following this distribution.

Keywords: Harris Generalization; Harris Generalized Linear Exponential Distribution; Reliability Test Plan (search for similar items in EconPapers)
Date: 2018
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DOI: 10.1515/eqc-2017-0025

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