Multiple Dependent State Sampling Inspection Plan for Lindley Distributed Quality Characteristic

Biswas Shovan () and Maiti Sudhansu S. ()
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Biswas Shovan: Department of Statistics, Burdwan Raj College, Burdwan, India
Maiti Sudhansu S.: Department of Statistics, Visva-Bharati University, Santiniketan, India

Stochastics and Quality Control, 2022, vol. 37, issue 1, 85-99

Abstract: This article develops multiple dependent state (MDS) sampling inspection plans based on the mean of lifetime quality characteristic that follows non-normal distributions viz., exponential and Lindley distribution. In this plan, the lot quality is measured by the lot mean (𝜇). We have estimated the optimal plan parameters of the proposed technique by non-linear optimization approaches considering acceptable quality level and rejection quality level. We have compared the sample size between the MDS sampling inspection plan and the single sampling inspection plan for the variable. Finally, we have taken two examples to illustrate the proposed technique.

Keywords: Consumer’s Risk; Lindley Distribution; Operating Characteristics (OC) Curve; Producer’s Risk; Single Sampling Inspection Plan (search for similar items in EconPapers)
Date: 2022
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DOI: 10.1515/eqc-2021-0038

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