Time Truncated Attribute Median Control Charts for Logistic-Exponential Process Distribution

Saha Mahendra (), Pareek Pratibha (), Maheshwari Sparsh () and Pandey Arvind ()
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Saha Mahendra: Department of Statistics, University of Delhi, Delhi, India
Pareek Pratibha: Department of Statistics, Central University of Rajasthan, Rajasthan, India
Maheshwari Sparsh: Department of Statistics, Central University of Rajasthan, Rajasthan, India
Pandey Arvind: Department of Statistics, Central University of Rajasthan, Rajasthan, India

Stochastics and Quality Control, 2024, vol. 39, issue 2, 91-104

Abstract: In this article, time truncated attribute control chart is proposed for logistic-exponential distribution based on four acceptance sampling plans. The performance of the proposed control chart is evaluated in terms of average run length. Furthermore, the efficiency of the proposed attribute control chart is compared for all given acceptance sampling plans, viz., single sampling plan, repetitive sampling plan, multiple dependent state sampling plan and multiple dependent state repetitive sampling plan. Also, the application of the proposed control chart is illustrated by using real life example.

Keywords: Average Run Length; Multiple Dependent State Sampling Plan; Multiple Dependent State Repetitive Sampling Plan; Median Lifetime; Repetitive Sampling Plan (search for similar items in EconPapers)
Date: 2024
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DOI: 10.1515/eqc-2023-0040

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