A New Synthetic Triple Sampling X̅ Control Chart

Mim Faijun Nahar (), Tasnim Rawnak (), Khoo Michael B. C. (), Saha Sajal (), Ali Md. Hazrat () and Chua Shanyu ()
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Mim Faijun Nahar: Department of Statistics, Mawlana Bhashani Science and Technology University, 1902 Santosh, Tangail, Bangladesh
Tasnim Rawnak: International Finance Investment and Commerce Bank PLC, Chittagong, Bangladesh
Khoo Michael B. C.: School of Mathematical Sciences, Universiti Sains Malaysia, 11800 Minden, Penang, Malaysia
Saha Sajal: Department of Mathematics, International University of Business Agriculture and Technology, 1230 Dhaka, Bangladesh
Ali Md. Hazrat: Department of Statistics, Mawlana Bhashani Science and Technology University, 1902 Santosh, Tangail, Bangladesh
Chua Shanyu: Estek Automation Sdn Bhd, No. 53, Jalan Sungai Tiram 2, Nyaman Mutiara Light Industrial Park 2, Sungai Tiram, 11900 Bayan Lepas, Penang, Malaysia

Stochastics and Quality Control, 2025, vol. 40, issue 2, 159-170

Abstract: In this study, the synthetic triple sampling (STS) X ¯ {\overline{X}} chart is introduced to monitor the process mean more effectively. The developed STS X ¯ {\overline{X}} chart combines the triple sampling (TS) X ¯ {\overline{X}} chart and the conforming run length (CRL) chart to enhance shift detection capabilities. The performance of the STS X ¯ {\overline{X}} chart is compared with that of the TS X ¯ {\overline{X}} and synthetic double sampling (SDS) X ¯ {\overline{X}} charts on the basis of the average number of observations to signal (ANOS) and expected ANOS (EANOS) as key performance metrics. Results show that the process shift detection effectiveness of the STS X ¯ {\overline{X}} chart is generally superior to that of the TS X ¯ {\overline{X}} and SDS X ¯ {\overline{X}} charts. Real industrial data are adopted to demonstrate the implementation of the STS X ¯ {\overline{X}} chart.

Keywords: STS Chart; SDS Chart; TS Chart; ANOS; EANOS (search for similar items in EconPapers)
Date: 2025
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DOI: 10.1515/eqc-2025-0032

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