Properties of thin metallic films for microwave susceptors

J. Česnek, J. Dobiáš, J. Houšová and J. Sedláček
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J. Česnek: Romill, s.r.o., Brno, Czech Republic
J. Dobiáš: Romill, s.r.o., Brno, Czech Republic
J. Houšová: Romill, s.r.o., Brno, Czech Republic
J. Sedláček: Romill, s.r.o., Brno, Czech Republic

Czech Journal of Food Sciences, 2003, vol. 21, issue 1, 34-40

Abstract: Thin Al films of varying thickness, i.e. 3 to 30 nm, were deposited onto polyethylene-terephthalate film by evaporation in the vacuum of 3 × 10-3 Pa. The dependence of DC (direct current) surface resistance on thickness was measured using a four-point method. The surface resistance exhibits the size effect in accordance with the Fuchs-Sondheimer theory. The microwave absorption properties of the prepared films of various metallization thickness were measured in a microwave field at the microwave power of 1.8 mW. The maximum microwave absorption at 2.45 GHz was found to occur in a layer of optical density of about 0.22.

Keywords: microwave susceptors; food packaging; optical density; DC surface resistance; microwave absorption (search for similar items in EconPapers)
Date: 2003
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Persistent link: https://EconPapers.repec.org/RePEc:caa:jnlcjf:v:21:y:2003:i:1:id:3475-cjfs

DOI: 10.17221/3475-CJFS

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