Breeding for root characters and grain yield in wheat

J.G. Waines and B. Ehdaie
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J.G. Waines: Department of Botany and Plant Sciences, University of California, Riverside, California, CA 92521-0124, U.S.A., e-mail: giles.waines@ucr.edu
B. Ehdaie: Department of Botany and Plant Sciences, University of California, Riverside, California, CA 92521-0124, U.S.A., e-mail: giles.waines@ucr.edu

Czech Journal of Genetics and Plant Breeding, 2005, vol. 41, issue SpecialIssue, 326-330

Keywords: bread wheat; durum wheat; root biomass; root branching; root depth; grain yield (search for similar items in EconPapers)
Date: 2005
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Persistent link: https://EconPapers.repec.org/RePEc:caa:jnlcjg:v:41:y:2005:i:specialissue:id:6212-cjgpb

DOI: 10.17221/6212-CJGPB

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