Increased field resistance to Tilletia caries provided by a specific anti-fungal virus gene in genetically engineered wheat
T. Schlaich,
B. Urbaniak,
N. Malgras,
E. Ehler,
C. Birrer,
L. Meier and
C. Sautter
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T. Schlaich: Institute of Plant Sciences, ETH Zürich, Universitaetsstr. 2, 8092 Zürich, Switzerland,
B. Urbaniak: Institute of Plant Sciences, ETH Zürich, Universitaetsstr. 2, 8092 Zürich, Switzerland,
N. Malgras: Institute of Plant Sciences, ETH Zürich, Universitaetsstr. 2, 8092 Zürich, Switzerland,
E. Ehler: Institute of Plant Sciences, ETH Zürich, Universitaetsstr. 2, 8092 Zürich, Switzerland,
C. Birrer: Institute of Plant Sciences, ETH Zürich, Universitaetsstr. 2, 8092 Zürich, Switzerland,
L. Meier: Institute of Plant Sciences, ETH Zürich, Universitaetsstr. 2, 8092 Zürich, Switzerland,
C. Sautter: Institute of Plant Sciences, ETH Zürich, Universitaetsstr. 2, 8092 Zürich, Switzerland,
Czech Journal of Genetics and Plant Breeding, 2006, vol. 42, issue SpecialIssue, 5
Keywords: wheat; varieties; KP4; resistance; genetic engineering (search for similar items in EconPapers)
Date: 2006
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Persistent link: https://EconPapers.repec.org/RePEc:caa:jnlcjg:v:42:y:2006:i:specialissue:id:6219-cjgpb
DOI: 10.17221/6219-CJGPB
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