DNA marker of Tilletia controversa Kühn, a causal agent of wheat dwarf bunt

W.-Q. Chen, T.-G. Liu, J.-H. Liu and S.-C. Xu
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W.-Q. Chen: State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Science, Beijing 100094, P.R.China
T.-G. Liu: State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Science, Beijing 100094, P.R.China
J.-H. Liu: State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Science, Beijing 100094, P.R.China
S.-C. Xu: State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Science, Beijing 100094, P.R.China

Czech Journal of Genetics and Plant Breeding, 2006, vol. 42, issue SpecialIssue, 13

Keywords: dwarf bunt of wheat; Tilletia controversa Kühn; AFLP; SCAR marker; genetic diversity (search for similar items in EconPapers)
Date: 2006
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Persistent link: https://EconPapers.repec.org/RePEc:caa:jnlcjg:v:42:y:2006:i:specialissue:id:6221-cjgpb

DOI: 10.17221/6221-CJGPB

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