Mutations in wheat leading to enhanced resistance to the fungal pathogen of yellow rust

L.A. Boyd, J.A. Howie, T. Worland, R. Stratford and P.H. Smith
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L.A. Boyd: John Innes Centre, Department of Disease and Stress Biology, Norwich, NR4 7UH
J.A. Howie: John Innes Centre, Department of Disease and Stress Biology, Norwich, NR4 7UH
T. Worland: John Innes Centre, Department of Disease and Stress Biology, Norwich, NR4 7UH
R. Stratford: John Innes Centre, Department of Disease and Stress Biology, Norwich, NR4 7UH
P.H. Smith: John Innes Centre, Department of Disease and Stress Biology, Norwich, NR4 7UH

Plant Protection Science, 2002, vol. 38, issue SI1-6thConfEFPP, S73-S75

Abstract: The isolation and study of plant resistance genes is revealing a story more complicated than the gene-for-gene hypothesis originally implied. The story of resistance is complicated even further by the discovery of genes that appear to have a negative effect on resistance. Early studies in the wheat line Hobbit 'sib' identified a number of chromosomes that reduced the level of field resistance to the fungal pathogen Puccinia striiformis f.sp. tritici, the causal agent of yellow rust on wheat. From a series of deletion mutants generated in Hobbit 'sib' a number of mutant lines were selected that gave enhanced resistance to yellow rust. The phenotypic, genetic and molecular characterisation of some of these mutants is presented.

Keywords: mutants; wheat; yellow rust (search for similar items in EconPapers)
Date: 2002
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Persistent link: https://EconPapers.repec.org/RePEc:caa:jnlpps:v:38:y:2002:i:si1-6thconfefpp:id:10324-pps

DOI: 10.17221/10324-PPS

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