Genetics of wheat somaclones resistance to Bipolaris sorokiniana Shoem

L.G. Tyryshkin and N.A. Tyryshkina-Shishelova
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L.G. Tyryshkin: Vavilov All-Russian Institute of Plant Industry (VIR), 190000 St.-Petersburg, Russia * Tel.: +7 812 466 4704, Fax: +7 812 113 7094, E-mail: tyr@na8418.spb.edu
N.A. Tyryshkina-Shishelova: Vavilov All-Russian Institute of Plant Industry (VIR), 190000 St.-Petersburg, Russia * Tel.: +7 812 466 4704, Fax: +7 812 113 7094, E-mail: tyr@na8418.spb.edu

Plant Protection Science, 2002, vol. 38, issue SI1-6thConfEFPP, 186-188

Abstract: Genetics of resistance to common root rot and dark brown leaf spot blotch (both caused by Bipolaris sorokiniana Shoem.)was studied in wheat somaclonal lines, obtained in calluses culture of samples 181-5 and Vera. Four different approacheswere used: linear analysis of resistance in generations of segregating somaclonal lines, hybridological analysis, studyof resistance components, study of possible durability of resistance. Results showed, that resistance to both diseases islikely controlled by polygenic systems with additive actions of minor genes. Different lines possess non-identical geneticsystems for resistance. Several lines kept their initial level of resistance to spot blotch after 5 cycles of the pathogenartificial population reproduction.

Keywords: wheat; somaclonal variability; genetics of resistance; dark brown leaf spot blotch; common root rot; Bipolarissorokiniana (search for similar items in EconPapers)
Date: 2002
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DOI: 10.17221/10352-PPS

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