Two-way imputation: A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation

Joost R. Van Ginkel, L. Andries Van der Ark, Klaas Sijtsma and Jeroen K. Vermunt

Computational Statistics & Data Analysis, 2007, vol. 51, issue 8, 4013-4027

Date: 2007
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