Accelerated reliability demonstration under competing failure modes
Wei Luo,
Chun-hua Zhang,
Xun Chen and
Yuan-yuan Tan
Reliability Engineering and System Safety, 2015, vol. 136, issue C, 75-84
Abstract:
The conventional reliability demonstration tests are difficult to apply to products with competing failure modes due to the complexity of the lifetime models. This paper develops a testing methodology based on the reliability target allocation for reliability demonstration under competing failure modes at accelerated conditions. The specified reliability at mission time and the risk caused by sampling of the reliability target for products are allocated for each failure mode. The risk caused by degradation measurement fitting of the target for a product involving performance degradation is equally allocated to each degradation failure mode. According to the allocated targets, the accelerated life reliability demonstration test (ALRDT) plans for the failure modes are designed. The accelerated degradation reliability demonstration test plans and the associated ALRDT plans for the degradation failure modes are also designed. Next, the test plan and the decision rules for the products are designed. Additionally, the effects of the discreteness of sample size and accepted number of failures for failure modes on the actual risks caused by sampling for the products are investigated.
Keywords: Reliability demonstration; Competing failure modes; Reliability allocation; Accelerated testing; Performance degradation (search for similar items in EconPapers)
Date: 2015
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Citations: View citations in EconPapers (6)
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Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:136:y:2015:i:c:p:75-84
DOI: 10.1016/j.ress.2014.11.014
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