Robust D-optimal designs under correlated error, applicable invariantly for some lifetime distributions

Rabindra Nath Das, Jinseog Kim and Jeong-Soo Park

Reliability Engineering and System Safety, 2015, vol. 136, issue C, 92-100

Abstract: In quality engineering, the most commonly used lifetime distributions are log-normal, exponential, gamma and Weibull. Experimental designs are useful for predicting the optimal operating conditions of the process in lifetime improvement experiments. In the present article, invariant robust first-order D-optimal designs are derived for correlated lifetime responses having the above four distributions. Robust designs are developed for some correlated error structures. It is shown that robust first-order D-optimal designs for these lifetime distributions are always robust rotatable but the converse is not true. Moreover, it is observed that these designs depend on the respective error covariance structure but are invariant to the above four lifetime distributions. This article generalizes the results of Das and Lin [7] for the above four lifetime distributions with general (intra-class, inter-class, compound symmetry, and tri-diagonal) correlated error structures.

Keywords: D-optimal design; Inter-class correlation; Mean life; Random effect; Response surface; Robust rotatability; Tri-diagonal correlation; Weibull distribution (search for similar items in EconPapers)
Date: 2015
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Citations: View citations in EconPapers (1)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:136:y:2015:i:c:p:92-100

DOI: 10.1016/j.ress.2014.12.001

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