Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing

Chunhua Zhang, Xiang Lu, Yuanyuan Tan and Yashun Wang

Reliability Engineering and System Safety, 2015, vol. 142, issue C, 369-377

Abstract: For products with high reliability and long lifetime, accelerated degradation testing (ADT) may be adopted during product development phase to verify whether its reliability satisfies the predetermined level within feasible test duration. The actual degradation from engineering is usually a strictly monotonic process, such as fatigue crack growth, wear, and erosion. However, the method for reliability demonstration by ADT with monotonic degradation process has not been investigated so far. This paper proposes a reliability demonstration methodology by ADT for this kind of product. We first apply Gamma process to describe the monotonic degradation. Next, we present a reliability demonstration method by converting the required reliability level into allowable cumulative degradation in ADT and comparing the actual accumulative degradation with the allowable level. Further, we suggest an analytical optimal ADT design method for more efficient reliability demonstration by minimizing the asymptotic variance of decision variable in reliability demonstration under the constraints of sample size, test duration, test cost, and predetermined decision risks. The method is validated and illustrated with example on reliability demonstration of alloy product, and is applied to demonstrate the wear reliability within long service duration of spherical plain bearing in the end.

Keywords: Reliability demonstration; Accelerated degradation testing; Degradation; Gamma process; Optimal test plan (search for similar items in EconPapers)
Date: 2015
References: View complete reference list from CitEc
Citations: View citations in EconPapers (12)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:142:y:2015:i:c:p:369-377

DOI: 10.1016/j.ress.2015.05.011

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