Optimal loading of elements in series systems exposed to external shocks
Gregory Levitin and
Maxim Finkelstein
Reliability Engineering and System Safety, 2019, vol. 192, issue C
Abstract:
This paper considers specific series systems exposed to external shocks and internal failures. The systems must complete a specified amount of work. The system elements can operate with different load levels that determine their performance and internal failure rates. The increase of the elements’ loading, on one hand increases their internal failure rate, but, on the other hand, it increases its performance level, which leads to reduction of the mission time. The optimal loading should achieve the balance between these two effects and provide the largest mission success probability. Two different types of series systems characterized by different definitions of time during which the elements are exposed to external shocks are considered. The cases when the elements are exposed to a common shock process and to different independent shock processes are also analyzed. Illustrative examples are presented.
Keywords: Loading; Poisson process; Optimization; Series system; Mission success (search for similar items in EconPapers)
Date: 2019
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (6)
Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S095183201730100X
Full text for ScienceDirect subscribers only
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:192:y:2019:i:c:s095183201730100x
DOI: 10.1016/j.ress.2017.08.009
Access Statistics for this article
Reliability Engineering and System Safety is currently edited by Carlos Guedes Soares
More articles in Reliability Engineering and System Safety from Elsevier
Bibliographic data for series maintained by Catherine Liu ().