Developing k-out-of-n: G multilevel system with mixed redundancy strategy to protect DSP code using simplified swarm optimization

Tsung-Jung Hsieh

Reliability Engineering and System Safety, 2025, vol. 260, issue C

Abstract: Mitigating transient faults in aerospace software, particularly radiation-induced Single-Event Upsets (SEUs) affecting Digital Signal Processor (DSP) code, remains a critical challenge. Redundancy strategies are among the most effective approaches to address SEUs. This study introduces a novel program architecture based on a k-out-of-n: G system, incorporating mixed redundancy strategies to enhance the reliability of DSP code. As DSP code operates within a multilevel system, this is the first study to integrate a multilevel system with k-out-of-n: G modules using mixed redundancy strategies. This integration allows for diverse combinations of subsystem reliability calculations, making it strategically advantageous. To evaluate the reliability of redundant program modules in each subsystem, a modular continuous-time Markov chain (CTMC) was applied. To address the extensive combinations of k and n values alongside redundancy strategies, simplified swarm optimization (SSO) was employed for multilevel encoding and near-optimal solution discovery. Experiments on the Fast Fourier Transformation (FFT) program demonstrated the method's effectiveness compared to state-of-the-art approaches, further verifying its scalability and capability to establish a more stable and highly reliable DSP code architecture for large-scale problems.

Keywords: k-out-of-n: G system; Digital signal processor; Multilevel system; Mixed redundancy strategy; Continuous time Markov chain (search for similar items in EconPapers)
Date: 2025
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0951832025001516
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:260:y:2025:i:c:s0951832025001516

DOI: 10.1016/j.ress.2025.110948

Access Statistics for this article

Reliability Engineering and System Safety is currently edited by Carlos Guedes Soares

More articles in Reliability Engineering and System Safety from Elsevier
Bibliographic data for series maintained by Catherine Liu ().