Reliability demonstration test planning: A three dimensional consideration

Om Prakash Yadav, Nanua Singh and Parveen S. Goel

Reliability Engineering and System Safety, 2006, vol. 91, issue 8, 882-893

Abstract: Increasing customer demand for reliability, fierce market competition on time-to-market and cost, and highly reliable products are making reliability testing more challenging task. This paper presents a systematic approach for identifying critical elements (subsystems and components) of the system and deciding the types of test to be performed to demonstrate reliability. It decomposes the system into three dimensions, (i.e. physical, functional and time) and identifies critical elements in the design by allocating system level reliability to each candidate. The decomposition of system level reliability is achieved by using criticality index. The numerical value of criticality index for each candidate is derived based on the information available from failure mode and effects analysis (FMEA) document or warranty data from a prior system. It makes use of this information to develop reliability demonstration test plan for the identified (critical) failure mechanisms and physical elements. It also highlights the benefits of using prior information in order to locate critical spots in the design and in subsequent development of test plans. A case example is presented to demonstrate the proposed approach.

Keywords: Reliability demonstration; Product development; Reliability improvement (search for similar items in EconPapers)
Date: 2006
References: View complete reference list from CitEc
Citations: View citations in EconPapers (11)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:91:y:2006:i:8:p:882-893

DOI: 10.1016/j.ress.2005.09.001

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