Using simultaneous higher-level and partial lower-level data in reliability assessments

T.L. Graves, M.S. Hamada, R.M. Klamann, A.C. Koehler and H.F. Martz

Reliability Engineering and System Safety, 2008, vol. 93, issue 8, 1273-1279

Abstract: When a system is tested, besides system data, some lower-level data may become available such as a particular subsystem or component was successful or failed. Treating such simultaneous multi-level data as independent is a mistake because they are dependent. In this paper, we show how to handle simultaneous multi-level data correctly in a reliability assessment. We do this by determining what information the simultaneous data provides in terms of the component reliabilities using generalized cut sets. We illustrate this methodology with an example of a low-pressure coolant injection system using a Bayesian approach to make reliability assessments.

Keywords: Bayesian methods; Generalized cut sets; Markov chain Monte Carlo; Simultaneous multi-level data; Success/failure data (search for similar items in EconPapers)
Date: 2008
References: View complete reference list from CitEc
Citations: View citations in EconPapers (13)

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0951832007001780
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:93:y:2008:i:8:p:1273-1279

DOI: 10.1016/j.ress.2007.07.002

Access Statistics for this article

Reliability Engineering and System Safety is currently edited by Carlos Guedes Soares

More articles in Reliability Engineering and System Safety from Elsevier
Bibliographic data for series maintained by Catherine Liu ().