Reliability analysis of discrete event dynamic systems with Petri nets

Nabil Sadou and Hamid Demmou

Reliability Engineering and System Safety, 2009, vol. 94, issue 11, 1848-1861

Abstract: This paper deals with dynamic reliability of embedded systems. It presents a method for deriving feared scenarios (which might lead the system to a critical situation) in Petri nets. A classical way to obtain scenarios in Petri nets is to generate the reachability graph. However, for complex systems, it leads to the state space explosion. To avoid this problem, in our approach, Petri net reachability is translated into provability of linear logic sequents. Linear logic bases are introduced and used to formally define scenarios and minimality of scenarios. These definitions allow the method to produce only pertinent scenarios. The steps of the method are described and illustrated through a landing-gear system example.

Keywords: Embedded systems; Reliability analysis; Petri net; Linear logic; Feared scenarios; Minimality (search for similar items in EconPapers)
Date: 2009
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Citations: View citations in EconPapers (12)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:94:y:2009:i:11:p:1848-1861

DOI: 10.1016/j.ress.2009.06.006

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