Non-parametric adaptive importance sampling for the probability estimation of a launcher impact position

Morio, Jérôme

Reliability Engineering and System Safety, 2011, vol. 96, issue 1, 178-183

Abstract: Importance sampling (IS) is a useful simulation technique to estimate critical probability with a better accuracy than Monte Carlo methods. It consists in generating random weighted samples from an auxiliary distribution rather than the distribution of interest. The crucial part of this algorithm is the choice of an efficient auxiliary PDF that has to be able to simulate more rare random events. The optimisation of this auxiliary distribution is often in practice very difficult. In this article, we propose to approach the IS optimal auxiliary density with non-parametric adaptive importance sampling (NAIS). We apply this technique for the probability estimation of spatial launcher impact position since it has currently become a more and more important issue in the field of aeronautics.

Keywords: Launcher safety; Non-parametric statistics; Probability estimation; Adaptive importance sampling (search for similar items in EconPapers)
Date: 2011
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Citations: View citations in EconPapers (11)

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Persistent link: https://EconPapers.repec.org/RePEc:eee:reensy:v:96:y:2011:i:1:p:178-183

DOI: 10.1016/j.ress.2010.08.006

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