Asymptotic failure distributions

Gary Gottlieb

Stochastic Processes and their Applications, 1981, vol. 11, issue 1, 47-56

Abstract: We consider a single device shock model in which the shocks arrive as a renewal process. We study the asymptotic shape of the failure distribution and find conditions on the renewal process and the ability of the device to survive shocks so that the failure distribution is asymptotically Increasing Failure Rate.

Keywords: Shock; models; increasing; failure; rate; renewal; processes; reliability; theory; total; positivity; random; barriers (search for similar items in EconPapers)
Date: 1981
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