On the limiting distribution of and critical values for an origin-invariant bivariate Cramer--von Mises-type statistic
Dale L. Zimmerman
Statistics & Probability Letters, 1994, vol. 20, issue 3, 189-195
Abstract:
The bivariate Cramer--von Mises statistic has been proposed as a basis for goodness-of-fit testing for continuous bivariate distributions. This statistic can be expressed as the integral, over the unit square I2, of the square of the bivariate uniform empirical process. For some time it apparently went unnoticed that this statistic's value is not 'origin-invariant', i.e., its value depends on which corner of I2 is identified as the origin. Zimmerman (1993) proposed a modification of the bivariate Cramer--von Mises statistic that does not suffer from this defect. In this paper this statistic's limiting null distribution is derived and tabulated using the principal component decomposition method.
Keywords: Bivariate; uniform; empirical; process; Bivariate; goodness-of-fit; test; Cramer--von; Mises; statistic; Principal; component; decomposition (search for similar items in EconPapers)
Date: 1994
References: Add references at CitEc
Citations:
Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/0167-7152(94)90041-8
Full text for ScienceDirect subscribers only
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:eee:stapro:v:20:y:1994:i:3:p:189-195
Ordering information: This journal article can be ordered from
http://www.elsevier.com/wps/find/supportfaq.cws_home/regional
https://shop.elsevie ... _01_ooc_1&version=01
Access Statistics for this article
Statistics & Probability Letters is currently edited by Somnath Datta and Hira L. Koul
More articles in Statistics & Probability Letters from Elsevier
Bibliographic data for series maintained by Catherine Liu ().