On the tail probability of the longest well-matching run

C. J. Chang, C. S. J. Fann, W. C. Chou and I. B. Lian

Statistics & Probability Letters, 2003, vol. 63, issue 3, 267-274

Abstract: The distribution of the length of the longest run has wide applications in regard to reliability and DNA sequencing. Statistical tests based on the longest well-matching run are usually considered to be more reasonable than tests based on the perfect-matching run. In this paper, a method adopted from Fu and Koutras (J. Amer. Statist. Assoc. 89 (1994) 1050) is proposed to improve the efficiency of computing the exact distribution of length. We used the result to investigate the accuracy of some approximations of the distribution.

Keywords: Run; test; Markov; chain; embedding; k-Interrupted; run (search for similar items in EconPapers)
Date: 2003
References: View complete reference list from CitEc
Citations: View citations in EconPapers (2)

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