Minimal repair under a step-stress test

N. Balakrishnan, U. Kamps and M. Kateri

Statistics & Probability Letters, 2009, vol. 79, issue 13, 1548-1558

Abstract: In the one- and multi-sample cases, in the context of life-testing reliability experiments, we introduce minimal repair processes under a simple step-stress test, based on exponential distributions and an associated cumulative exposure model, and then develop likelihood inference for such a model.

Date: 2009
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