A new concept for count distributions

Per-Erik Hagmark

Statistics & Probability Letters, 2009, vol. 79, issue 8, 1120-1124

Abstract: A new concept, called silhouette, and the related parameterization are introduced and studied. Applications show how to extend maximally the mean-variance domain of a count distribution, and how to construct a single variable for any mean-variance and any requirements on distribution shape.

Date: 2009
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