A class of semiparametric rank-based tests for right-truncated data

Pao-sheng Shen

Statistics & Probability Letters, 2010, vol. 80, issue 17-18, 1459-1466

Abstract: A class of semiparametric rank-based tests is proposed for the two-sample problem with right-truncated data, where the truncation distribution is parameterized, while the lifetime distribution is left unspecified. The class contains as special cases the extension of the semiparametric Mann-Whitney test proposed by Bilker and Wang (1996) for right-truncated data. The asymptotic distribution theory of the test is presented. The small-sample performance of the test is investigated under a variety of situations by means of Monte Carlo simulations.

Keywords: Retrospective; sampling; Semiparametric; model; Two-sample; tests (search for similar items in EconPapers)
Date: 2010
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