Some new lower bounds to centered and wrap-round L2-discrepancies

Kashinath Chatterjee, Zhaohai Li and Hong Qin

Statistics & Probability Letters, 2012, vol. 82, issue 7, 1367-1373

Abstract: We study the uniformity of two-level U-type designs based on the centered and wrap-around L2-discrepancies. Based on the known formulation of the measures of uniformity, we present some new lower bounds to centered and wrap-around L2-discrepancies, which can be used as benchmarks in searching uniform U-type designs or helping to proof that a good design is in fact uniform. Using the efficient algorithm proposed in Fang et al. (2003), some two-level uniform designs are obtained.

Keywords: U-type designs; Centered L2-discrepancy; Wrap-around L2-discrepancy (search for similar items in EconPapers)
Date: 2012
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (7)

Downloads: (external link)
http://www.sciencedirect.com/science/article/pii/S0167715212000831
Full text for ScienceDirect subscribers only

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:eee:stapro:v:82:y:2012:i:7:p:1367-1373

Ordering information: This journal article can be ordered from
http://www.elsevier.com/wps/find/supportfaq.cws_home/regional
https://shop.elsevie ... _01_ooc_1&version=01

DOI: 10.1016/j.spl.2012.03.011

Access Statistics for this article

Statistics & Probability Letters is currently edited by Somnath Datta and Hira L. Koul

More articles in Statistics & Probability Letters from Elsevier
Bibliographic data for series maintained by Catherine Liu ().