Experimental Spectroscopic Data of SnO 2 Films and Powder

Hawazin Alghamdi, Olasunbo Z. Farinre, Mathew L. Kelley, Adam J. Biacchi, Dipanjan Saha, Tehseen Adel, Kerry Siebein, Angela R. Hight Walker, Christina A. Hacker, Albert F. Rigosi and Prabhakar Misra ()
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Hawazin Alghamdi: Department of Physics and Astronomy, Howard University, Washington, DC 20059, USA
Olasunbo Z. Farinre: Department of Physics and Astronomy, Howard University, Washington, DC 20059, USA
Mathew L. Kelley: Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Adam J. Biacchi: Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Dipanjan Saha: Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Tehseen Adel: Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Kerry Siebein: Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Angela R. Hight Walker: Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Christina A. Hacker: Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Albert F. Rigosi: Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA
Prabhakar Misra: Department of Physics and Astronomy, Howard University, Washington, DC 20059, USA

Data, 2023, vol. 8, issue 2, 1-15

Abstract: Powders and films composed of tin dioxide (SnO 2 ) are promising candidates for a variety of high-impact applications, and despite the material’s prevalence in such studies, it remains of high importance that commercially available materials meet the quality demands of the industries that these materials would most benefit. Imaging techniques, such as scanning electron microscopy (SEM), atomic force microscopy (AFM), were used in conjunction with Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) to assess the quality of a variety of samples, such as powder and thin film on quartz with thicknesses of 41 nm, 78 nm, 97 nm, 373 nm, and 908 nm. In this study, the dependencies of the corresponding Raman, XPS, and SEM analysis results on properties of the samples, like the thickness and form (powder versus film) are determined. The outcomes achieved can be regarded as a guide for performing quality checks of such products, and as reference to evaluate commercially available samples.

Keywords: tin (IV) oxide powder; X-ray photoelectron spectroscopy; Raman spectroscopy (search for similar items in EconPapers)
JEL-codes: C8 C80 C81 C82 C83 (search for similar items in EconPapers)
Date: 2023
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