Photovoltaic Device Performance Evaluation Using an Open-Hardware System and Standard Calibrated Laboratory Instruments

Jesús Montes-Romero, Michel Piliougine, José Vicente Muñoz, Eduardo F. Fernández and Juan De la Casa
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Jesús Montes-Romero: IDEA Research Group, Universidad de Jaén, Campus de Las Lagunillas, 23071 Jaén, Spain
Michel Piliougine: Dpto. de Lenguajes y Ciencias de la Computación, Universidad de Málaga, Bulevar Louis Pasteur 35, 29071 Málaga, Spain
José Vicente Muñoz: IDEA Research Group, Universidad de Jaén, Campus de Las Lagunillas, 23071 Jaén, Spain
Eduardo F. Fernández: IDEA Research Group, Universidad de Jaén, Campus de Las Lagunillas, 23071 Jaén, Spain
Juan De la Casa: IDEA Research Group, Universidad de Jaén, Campus de Las Lagunillas, 23071 Jaén, Spain

Energies, 2017, vol. 10, issue 11, 1-19

Abstract: This article describes a complete characterization system for photovoltaic devices designed to acquire the current-voltage curve and to process the obtained data. The proposed system can be replicated for educational or research purposes without having wide knowledge about electronic engineering. Using standard calibrated instrumentation, commonly available in any laboratory, the accuracy of measurements is ensured. A capacitive load is used to bias the device due to its versatility and simplicity. The system includes a common part and an interchangeable part that must be designed depending on the electrical characteristics of each PV device. Control software, developed in LabVIEW, controls the equipment, performs automatic campaigns of measurements, and performs additional calculations in real time. These include different procedures to extrapolate the measurements to standard test conditions and methods to obtain the intrinsic parameters of the single diode model. A deep analysis of the uncertainty of measurement is also provided. Finally, the proposed system is validated by comparing the results obtained from some commercial photovoltaic modules to the measurements given by an independently accredited laboratory.

Keywords: I - V curve; outdoor measurements; uncertainty analysis; characterization system (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2017
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (2)

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