Force and Motion Characteristics of Contamination Particles near the High Voltage End of UHVDC Insulator

Lei Lan, Gongda Zhang, Yu Wang and Xishan Wen
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Lei Lan: School of Electrical Engineering, Wuhan University, Wuhan 430072, China
Gongda Zhang: School of Electrical Engineering, Wuhan University, Wuhan 430072, China
Yu Wang: School of Electrical Engineering, Wuhan University, Wuhan 430072, China
Xishan Wen: School of Electrical Engineering, Wuhan University, Wuhan 430072, China

Energies, 2017, vol. 10, issue 7, 1-11

Abstract: It is important to reveal the relations of physical factors to deposition of contaminants on insulator. In this paper, the simulation model of high voltage end of insulator was established to study the force and motion characteristics of particles affected by electric force and airflow drag force near the ultra-high voltage direct current (UHVDC) insulator. By finite element method, the electric field was set specially to be similar to the one near practical insulator, the steady fluid field was simulated. The electric force and air drag force were loaded on the uniformly charged particles. The characteristics of the two forces on particles, the relationship between quantity of electric charge on particles and probability of particles contacting the insulator were analyzed. It was found that, near the sheds, airflow drag force on particles is significantly greater than electric force with less electric charge. As the charge multiplies, electric force increases linearly, airflow drag force grows more slowly. There is a trend that the magnitude of electric force and drag force is going to similar. Meanwhile, the probability of particles contacting the insulator is increased too. However, at a certain level of charge which has different value with different airflow velocity, the contact probability has extremum here. After exceeding the value, as the charge increasing, the contact probability decreases gradually.

Keywords: electric force; air drag force; uniform charged; contact probability; contamination particle; multi-physics field (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2017
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