Traveling Wave Fault Location Using Layer Peeling

Stephen Robson, Abderrahmane Haddad and Huw Griffiths
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Stephen Robson: School of Engineering, Cardiff University, Cardiff CF24 3AA, UK
Abderrahmane Haddad: School of Engineering, Cardiff University, Cardiff CF24 3AA, UK
Huw Griffiths: Department of Electrical and Computer Engineering, Khalifa University, Abu Dhabi P.O. Box 127788, UAE

Energies, 2018, vol. 12, issue 1, 1-23

Abstract: Many fault-location algorithms rely on a simulation model incorporating network parameters which closely represent the real network. Estimations of the line parameters are usually based on limited geometrical information which do not reflect the complexity of a real network. In practice, obtaining an accurate model of the network is difficult without comprehensive field measurements of each constituent part of the network in question. Layer-peeling algorithms offer a solution to this problem by providing a fast “mapping” of the network based only on the response of a probing impulse. Starting with the classical “Schur” layer-peeling algorithm, this paper develops a new approach to map the reflection coefficients of an electrical network, then use this information post-fault to determine accurately and robustly the location of either permanent or incipient faults on overhead networks. The robustness of the method is derived from the similarity between the post-fault energy reaching the observation point and the predicted energy, which is based on real network observations rather than a simulation model. The method is shown to perform well for different noise levels and fault inception angles on the IEEE 13-bus network, indicating that the method is well suited to radial distribution networks.

Keywords: traveling wave; fault location; single-ended; layer peeling; schur algorithm (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2018
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (1)

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