Variations in Minority Carrier-Trapping Effects Caused by Hydrogen Passivation in Multicrystalline Silicon Wafer
Yujin Jung,
Kwan Hong Min,
Soohyun Bae,
Yoonmook Kang,
Donghwan Kim and
Hae-Seok Lee
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Yujin Jung: Department of Materials Science and Engineering, Korea University, Seoul 02841, Korea
Kwan Hong Min: Department of Materials Science and Engineering, Korea University, Seoul 02841, Korea
Soohyun Bae: Department of Materials Science and Engineering, Korea University, Seoul 02841, Korea
Yoonmook Kang: Department of Energy Environment Policy and Technology, KU-KIST Green School, Graduate School of Korea University, Seoul 02841, Korea
Donghwan Kim: Department of Materials Science and Engineering, Korea University, Seoul 02841, Korea
Hae-Seok Lee: Department of Energy Environment Policy and Technology, KU-KIST Green School, Graduate School of Korea University, Seoul 02841, Korea
Energies, 2020, vol. 13, issue 21, 1-11
Abstract:
In a multicrystalline silicon (mc-Si) wafer, trapping effects frequently occur in the carrier lifetime measurement based on the quasi-steady-state photoconductance (QSSPC) technique. This affects the accurate measurement of the carrier lifetime of an mc-Si solar cell by causing distortions at a low injection level close to the P max point. Therefore, it is necessary to understand this effect and effectively minimize the trapping-center density. In this study, the variations in the minority carrier-trapping effect of hydrogen at different annealing temperatures in an mc-Si were observed using QSSPC, time-of-flight secondary ion mass spectroscopy, and atom probe tomography. A trapping effect was confirmed and occurred in the grain boundary area, and the effect was reduced by hydrogen. Thus, in an mc-Si wafer, effective hydrogen passivation on the grain area and grain boundary is crucial and was experimentally proven to minimize the distortion of the carrier lifetime.
Keywords: multicrystalline silicon; trapping effect; photoconductance; grain boundary; hydrogen passivation (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2020
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