High-Impedance Fault Diagnosis: A Review

Abdulaziz Aljohani and Ibrahim Habiballah
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Abdulaziz Aljohani: Unconventional Resources Engineering and Project Management Department, Saudi Arabian Oil Company (Saudi Aramco), Dhahran 31311, Saudi Arabia
Ibrahim Habiballah: Electrical Engineering Department, King Fahd University of Petroleum and Minerals, Dhahran 31261, Saudi Arabia

Energies, 2020, vol. 13, issue 23, 1-18

Abstract: High-impedance faults (HIFs) represent one of the biggest challenges in power distribution networks. An HIF occurs when an electrical conductor unintentionally comes into contact with a highly resistive medium, resulting in a fault current lower than 75 amperes in medium-voltage circuits. Under such condition, the fault current is relatively close in value to the normal drawn ampere from the load, resulting in a condition of blindness towards HIFs by conventional overcurrent relays. This paper intends to review the literature related to the HIF phenomenon including models and characteristics. In this work, detection, classification, and location methodologies are reviewed. In addition, diagnosis techniques are categorized, evaluated, and compared with one another. Finally, disadvantages of current approaches and a look ahead to the future of fault diagnosis are discussed.

Keywords: high-impedance fault; fault detection techniques; fault location techniques; modeling; machine learning; signal processing; artificial neural networks; wavelet transform; Stockwell transform (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2020
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (2)

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