Detection and Diagnosis of Defect in GIS Based on X-ray Digital Imaging Technology

Tianhui Li, Xianhai Pang, Boyan Jia, Yanwei Xia, Siming Zeng, Hongliang Liu, Hao Tian, Fen Lin and Dan Wang
Additional contact information
Tianhui Li: State Grid Hebei Electric Power Research Institute, State Grid Hebei Electric Power Co., Ltd., Shijiazhuang 050021, China
Xianhai Pang: State Grid Hebei Electric Power Research Institute, State Grid Hebei Electric Power Co., Ltd., Shijiazhuang 050021, China
Boyan Jia: State Grid Hebei Electric Power Research Institute, State Grid Hebei Electric Power Co., Ltd., Shijiazhuang 050021, China
Yanwei Xia: State Grid Hebei Electric Power Research Institute, State Grid Hebei Electric Power Co., Ltd., Shijiazhuang 050021, China
Siming Zeng: State Grid Hebei Electric Power Research Institute, State Grid Hebei Electric Power Co., Ltd., Shijiazhuang 050021, China
Hongliang Liu: State Grid Hebei Electric Power Research Institute, State Grid Hebei Electric Power Co., Ltd., Shijiazhuang 050021, China
Hao Tian: Pinggao Group Co., Ltd., Pingdingshan 467001, China
Fen Lin: Xiamen Jiahua Electrical Technology Co., Ltd., Fuzhou 350026, China
Dan Wang: Hebei Institute of Communications, Shijiazhuang 050021, China

Energies, 2020, vol. 13, issue 3, 1-18

Abstract: For better application of X-ray digital imaging technology in defect detection in Gas Insulated Switchgear (GIS), it is essential to investigate the typical defect and establish the defect database, which has not been adequately performed in previous work. Systematic experimental research is also needed to accumulate data and experience. In this research, an experimental platform, including Computed Radiography (CR) imaging system and a GIS model, is built, and extensive tests of different kinds of typical defects are studied. The influence X-ray irradiation on SF 6 under different tube voltage levels is firstly examined, which proves that the withstand voltage of SF 6 gas has not been affected and no dissociation has been found. Then, several kinds of defects are tested by X-ray digital imaging technology. The successful application examples of “visual” detection of defects further prove the practicability and validity of the X-ray digital imaging technique. Finally, the image database of typical defects inside of GIS is established and the defect risk is also analyzed in three levels, which would be useful for the defect severity diagnosis and risk assessment.

Keywords: X-ray; gas insulated switchgear (GIS); SF 6; digital imaging technology (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2020
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (1)

Downloads: (external link)
https://www.mdpi.com/1996-1073/13/3/661/pdf (application/pdf)
https://www.mdpi.com/1996-1073/13/3/661/ (text/html)

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:gam:jeners:v:13:y:2020:i:3:p:661-:d:316457

Access Statistics for this article

Energies is currently edited by Ms. Agatha Cao

More articles in Energies from MDPI
Bibliographic data for series maintained by MDPI Indexing Manager ().