Source/Load-Pull Noise Measurements at K a Band

Sergio Colangeli, Walter Ciccognani, Patrick Ettore Longhi, Lorenzo Pace, Antonio Serino, Julien Poulain, Rémy Leblanc and Ernesto Limiti
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Sergio Colangeli: Electronics Engineering, University of Roma Tor Vergata, Via del Politecnico 1, 00133 Roma, Italy
Walter Ciccognani: Electronics Engineering, University of Roma Tor Vergata, Via del Politecnico 1, 00133 Roma, Italy
Patrick Ettore Longhi: Electronics Engineering, University of Roma Tor Vergata, Via del Politecnico 1, 00133 Roma, Italy
Lorenzo Pace: Electronics Engineering, University of Roma Tor Vergata, Via del Politecnico 1, 00133 Roma, Italy
Antonio Serino: Electronics Engineering, University of Roma Tor Vergata, Via del Politecnico 1, 00133 Roma, Italy
Julien Poulain: OMMIC SAS, 2 Rue du Moulin, 94453 Limeil Brévannes, France
Rémy Leblanc: OMMIC SAS, 2 Rue du Moulin, 94453 Limeil Brévannes, France
Ernesto Limiti: Electronics Engineering, University of Roma Tor Vergata, Via del Politecnico 1, 00133 Roma, Italy

Energies, 2021, vol. 14, issue 18, 1-15

Abstract: This paper is focused on the extraction of the noise parameters of a linear active device by exploiting both forward and reverse noise power measurements associated with different terminations. In order for load-pull measurements to yield a significant marginal improvement (as compared to forward measurements only) it is expected that the device under test should appreciably deviate from unidirectionality. For this reason, the source/load-pull technique is applied to frequencies at which the considered devices are still usable but their reverse noise factor exhibits a measurable dependence on the output terminations. Details on the test bench set up to the purpose, covering the 20–40 GHz frequency range, are provided. A characterization campaign on a 60 nm gate length, 4 × 35 µm GaN-on-Si HEMT fabricated by OMMIC is illustrated.

Keywords: black-box modeling; cold-source technique; Gallium Nitride on Silicon; HEMT; noise characterization; source pull; Y-factor technique (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2021
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