Low-Cost I–V Tracer for PV Fault Diagnosis Using Single-Diode Model Parameters and I–V Curve Characteristics

Vorachack Kongphet, Anne Migan-Dubois, Claude Delpha, Jean-Yves Lechenadec and Demba Diallo
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Vorachack Kongphet: GeePs, CentraleSupélec, CNRS, Université Paris-Saclay/Sorbonne Université, 3-11 Rue Joliot Curie, 91192 Gif Sur Yvette, France
Anne Migan-Dubois: GeePs, CentraleSupélec, CNRS, Université Paris-Saclay/Sorbonne Université, 3-11 Rue Joliot Curie, 91192 Gif Sur Yvette, France
Claude Delpha: CNRS, CentraleSupélec, Université Paris-Saclay, L2S, 3 Rue Joliot Curie, 91192 Gif Sur Yvette, France
Jean-Yves Lechenadec: IUT Cachan, Université Paris-Saclay, 9 Avenue de la Division Leclerc, 94230 Cachan, France
Demba Diallo: GeePs, CentraleSupélec, CNRS, Université Paris-Saclay/Sorbonne Université, 3-11 Rue Joliot Curie, 91192 Gif Sur Yvette, France

Energies, 2022, vol. 15, issue 15, 1-31

Abstract: The continuous health monitoring of PV modules is mandatory to maintain their high efficiency and minimize power losses due to faults or failures. In this work, a low-cost embedded tracer is developed to measure the I–V curve of a PV module in less than 0.2 s. The data are used to extract the five parameters of the single-diode model and its main characteristics (open-circuit voltage, short-circuit current, and maximum power). Experimental data are used to validate the analytical model and evaluate the two fault diagnosis methods, using as fault features the parameters of the single-diode model or the main characteristics of the I–V curve. The results, based on field data under different temperatures and irradiances, show that the degradation of series and shunt resistances could be detected more accurately with the main characteristics rather than with the parameters. However, the estimated parameters could still be used to monitor the long-term degradation effects.

Keywords: solar photovoltaic; I–V tracer; PV model; I–V curve; fault diagnosis (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2022
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