Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test

Chuanbao Du, Dewei Xia, Quan Huang, Congguang Mao, Zhitong Cui, Wenxiao Fang and Xin Nie
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Chuanbao Du: State Key Laboratory of IPRSE, Northwest Institute of Nuclear Technology, Xi’an 710000, China
Dewei Xia: The School of Engineering, High-Tech Institute of Xi’an, Xi’an 710075, China
Quan Huang: China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China
Congguang Mao: State Key Laboratory of IPRSE, Northwest Institute of Nuclear Technology, Xi’an 710000, China
Zhitong Cui: State Key Laboratory of IPRSE, Northwest Institute of Nuclear Technology, Xi’an 710000, China
Wenxiao Fang: China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China
Xin Nie: State Key Laboratory of IPRSE, Northwest Institute of Nuclear Technology, Xi’an 710000, China

Energies, 2022, vol. 15, issue 4, 1-13

Abstract: The study of electromagnetic sensitivity of electronic modules is crucial for the selection of a component-level pulse current injection (PCI) waveform, which will determine whether a component-level PCI test is equivalent to a system-level pulse illumination test of the system to which the electronic module belongs. For electromagnetic sensitivity analysis, the equivalence between the injection waveform and a typical high-altitude electromagnetic pulse (HEMP) conducted disturbance waveform in a component-level PCI test is studied. Based on an RF low noise amplifier (LNA) test board, component-level PCI tests were performed using 20 ns/500 ns double exponential wave and square-wave pulse with multiple pulse-widths. The damage threshold was analyzed and determined by using vector norm and its internal damage was observed and validated by optical microscopic analysis. The conclusions are demonstrated as follows: first, during square-wave PCI tests of RF LNA, the electromagnetic sensitive parameter action is divided into three regions by pulse-width range, called ∞ -norm, 2-norm and competitive failure-dominating regions; second, the electromagnetic damage effect of the RF LNA is mainly caused by the burning of its two cascaded transistors, forming a pulse energy transmission channel with short-circuit impedance from the input port to the ground; third, the 100 ns-width square waveform can be determined as the equivalent injection waveform of a HEMP conducted waveform, and the pulse peak value of injected current is determined as the electromagnetic sensitive parameter for square-wave PCI tests of the RF LNA. The conclusions verified the feasibility of establishing the equivalence between different pulse waveforms according to the electromagnetic sensitivity analysis based on the vector norm theory and effect mechanism analysis.

Keywords: pulsed current injection; low noise amplifier; HEMP; electromagnetic sensitivity; effect mechanism; vector norm theory (search for similar items in EconPapers)
JEL-codes: Q Q0 Q4 Q40 Q41 Q42 Q43 Q47 Q48 Q49 (search for similar items in EconPapers)
Date: 2022
References: View complete reference list from CitEc
Citations: View citations in EconPapers (1)

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